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Description

The Agilent / HP 4155A Semiconductor Parameter Analyzer offers high-resolution accuracy and a wide range. With the Agilent / HP 4155A Semiconductor Parameter Analyzer you can improve your semiconductor quality from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.

Features and Specifications of the Agilent / HP 4155A Semiconductor Parameter Analyzer include:

• I: 1 fA to 100 mA (20 fA offset accuracy)
• V: 1 micro V to 100 V
• Fully automated I-V sweep measurements with DC or Pulse Mode expandable up to 6 SMUs
• Synchronized stress/measure function
• Two high-voltage pulse generator units (+/- 40 V)
• Time domain measurement: 60 micro s - variable intervals up to 10,001 points
• Easy to use knob-sweep similar to curve tracer
• Automatic analysis functions
• Built-in Agilent / HP Instrument BASIC
• Trigger I/Q capability